This event will provide students, researchers, and industry representatives with an opportunity to explore the evolution of electron microscopy, deepen their understanding of advanced analysis techniques, and participate in live demonstrations in a real research environment.

Programme

09:00 – 09:30 Welcome Reception with coffee and pastries

09:30 – 09:45 Opening & Introduction of the Day

10:30 – 11:30 Lecture with Emanuel Katzmann - Presentation: TEM / CRYO TEM.

11:30 – 12:30 Lecture with Yamaguchi-san - Presentation: SEM imaging, CP and FIB sample prep.

12:30 – 13:30 Lunch Break

13:30 – 14:30 Lecture with Rick Verberne - Presentation: Analytical methods in electron microscopy - (EDS, windowless EDS, WDS, SXES, EBSD)

14:30 – 14:45 Discover electron microscopy platform - General introduction before guided lab tour with J.-F. Colomer

14:45 – 16:45 Hands-on Session - JEOL JCM-7000 Benchtop SEM - Discover how accessible and intuitive high-quality SEM imaging can be.

During this session we will demonstrate:

  • Suitable sample types and simple preparation guidelines
  • How to choose the optimal observation mode (SE, BSE, low vacuum, etc.)
  • Practical use of the instrument’s detectors and imaging features
  • Live sample analysis — feel free to bring your own samples - Please inform us in advance which samples you plan to bring.

Discussions, exchange ideas and Networking

Guided Tour of the Microscopes and Laboratories

16:45 – 17:15 Closing Sessions Q&A, drinks and snacks.

The event offers 1 ECTS credit to PhD students and a certificate of participation upon request.

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